Agilent 5600LS Atomic Force Microscope

The Agilent Technologies 5600 LS Series Atomic Force Microscope (AFM) is equipped for various scanning probe techniques, such as standard topography mapping of various materials including soft polymeric materials and biological samples, force spectroscopy and the determination of mechanical properties of a variety of materials including living cells, the mapping of surface functionalities, and the physicochemistry of surfaces and nanostructured materials.